HAST Test Chamber is suitable for the semiconductor chip industry, as well as electronic components, parts, integrated circuits, materials, and processes in fields such as aviation, aerospace, weapons, ships, nuclear industry, scientific research institutions, and universities. It confirms whether functional failure occurs due to durability (life) or environmental changes through accelerated high-temperature, high-humidity, high-pressure cycling and constant testing.
Prooduct Name |
Highly Accelerated Stress Test Chamber(HAST Chamber) |
Prooduct Model |
HPSC251-M |
HPSC252-M |
Working chamber volume |
51L |
51L×2 tanks |
Working chamber dimensions |
φ380×D450(R×D) |
φ380×D450(R×D)×2 tanks |
Tank Size |
φ450×D600(R×D) |
φ450×D600(R×D)×2 tanks |
External dimensions |
1200×1960×1140mm(W×H×D) |
1200×2170×1140mm(W×H×D) |
Temperature range |
105℃~150℃ |
Temperature fluctuation |
≤±0.5℃ |
Temperature uniformity |
≤2℃ |
Temperature deviation |
±2℃ |
Pressure Range |
110kPa~300kPa(Absolute Pressure) |